Comparative experimental study between tensile and compressive uniaxially stressed nMuGFETs under x-ray radiation focusing on analog behavior

Peruzzi, V.V.PeruzziGimenez, SalvadorSalvadorGimenezAgopian, PaulaPaulaAgopianSilveira, M.M.SilveiraMarino, JaoaJaoaMarinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22921Comparative experimental study between tensile and compressive uniaxially stressed nMuGFETs under x-ray radiation focusing on analog behaviorProceedings paper