Grasser, T.T.GrasserKaczer, BenBenKaczerGoes, W.W.GoesAichinger, T.T.AichingerHehenberger, P.P.HehenbergerNelhiebel, M.M.Nelhiebel2021-10-172021-10-1720090167-9317https://imec-publications.be/handle/20.500.12860/15390Understanding negative bias temperature instability in the context of hole trappingJournal article