Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?

Pichon, L.L.PichonMercha, AbdelkarimAbdelkarimMerchaRoutoure, J. M.J. M.RoutoureCarin, R.R.CarinBonnaud, O.O.BonnaudMohammed-Brahim, T.T.Mohammed-Brahim2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6721Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?Oral presentation