Franco, JacopoJacopoFrancoEneman, GeertGeertEnemanKaczer, BenBenKaczerMitard, JeromeJeromeMitardDe Jaeger, BriceBriceDe JaegerGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920111071-1023https://imec-publications.be/handle/20.500.12860/18924Impact of halo implant on the hot carrier reliability of germanium pMOSFETsJournal article