Defect and Fault Modeling Framework for STT-MRAM Testing

Wu, LizhouLizhouWuRao, SiddharthSiddharthRaoTaouil, MottaqiallahMottaqiallahTaouilMedeiros, Guilherme CardosoGuilherme CardosoMedeirosFieback, MoritzMoritzFiebackMarinissen, Erik JanErik JanMarinissenKar, Gouri SankarGouri SankarKarHamdioui, SaidSaidHamdioui2022-03-032022-03-0320212168-6750WOS:000658346300013https://imec-publications.be/handle/20.500.12860/39277Defect and Fault Modeling Framework for STT-MRAM TestingJournal article10.1109/TETC.2019.2960375WOS:000658346300013TUNNEL-JUNCTION STACKSRESISTIVE-OPENCOMPACT MODELBREAKDOWNDESIGN