Buffiere, MarieMarieBuffiereEl Mel, Abdel-AzizAbdel-AzizEl MelLenaers, NickNickLenaersRen, YiYiRenZaghi, ArminE.ArminE.ZaghiMols, YvesYvesMolsKoeble, C.C.KoebleVleugels, JefJefVleugelsMeuris, MarcMarcMeurisPoortmans, JefJefPoortmans2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22092Recombination stability in polycrystalline Cu2ZnSnSe4 thin filmsProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6744850