Stampfer, BernhardBernhardStampferSimicic, MarkoMarkoSimicicWeckx, PieterPieterWeckxAbbasi, ArashArashAbbasiKaczer, BenBenKaczerGrasser, TiborTiborGrasserWaltl, MichaelMichaelWaltl2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/34068Statistical characterization of BTI and RTN using pMOS arraysProceedings paper