IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair

Marinissen, Erik JanErik JanMarinissenPancholi, VineetVineetPancholiChuang, Po-YaoPo-YaoChuangKeim, MartinMartinKeim2024-09-112024-08-092024-09-112024979-8-3503-6379-11093-0167WOS:001239933000033https://imec-publications.be/handle/20.500.12860/44286IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and RepairProceedings paper10.1109/VTS60656.2024.10538776979-8-3503-6378-4WOS:001239933000033