Procel, Luis MiguelLuis MiguelProcelCrupi, FeliceFeliceCrupiFranco, JacopoJacopoFrancoTrojman, LionelLionelTrojmanKaczer, BenBenKaczer2021-10-222021-10-2220140741-3106https://imec-publications.be/handle/20.500.12860/24399Defect-centric distribution of channel hot carrier degradation in nano-MOSFETsJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6930741