A physically unclonable function featuring 0% BER using soft oxide breakdown positions in 40nm CMOS

Chuang, KentKentChuangBury, ErikErikBuryDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerLinten, DimitriDimitriLintenVerbauwhede, IngridIngridVerbauwhede2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30422A physically unclonable function featuring 0% BER using soft oxide breakdown positions in 40nm CMOSProceedings paperhttps://ieeexplore.ieee.org/document/8579252