Jech, MarkusMarkusJechUlmann, BiankaBiankaUlmannRzepa, GerhardGerhardRzepaTyaginov, StanislavStanislavTyaginovGrill, AlexanderAlexanderGrillWaltl, MichaelMichaelWaltlJabs, DominicDominicJabsJungemann, ChristophChristophJungemannGrasser, TiborTiborGrasser2021-10-272021-10-2720190018-9383https://imec-publications.be/handle/20.500.12860/33222Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theoryJournal articlehttps://ieeexplore.ieee.org/document/8527641