On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessment

Govoreanu, BogdanBogdanGovoreanuVan Houdt, JanJanVan Houdt2021-10-172021-10-172008-020741-3106https://imec-publications.be/handle/20.500.12860/13802On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessmentJournal article