Hot-carrier degradation behavior of N- and P-channel MOSFETs under dynamic operation conditions

Bellens, RudiRudiBellensGroeseneken, GuidoGuidoGroesenekenHeremans, PaulPaulHeremansMaes, HermanHermanMaes2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/29Hot-carrier degradation behavior of N- and P-channel MOSFETs under dynamic operation conditionsJournal article