Power GaN HEMT degradation: from time-dependent breakdown to hot-electron effects

Meneghini, MatteoMatteoMeneghiniBarbato, A.A.BarbatoBorga, MatteoMatteoBorgaDe Santi, CarlosCarlosDe SantiBarbato, M.M.BarbatoStoffels, SteveSteveStoffelsZhao, MingMingZhaoPosthuma, NielsNielsPosthumaDecoutere, StefaanStefaanDecoutereHaeberlen, OliverOliverHaeberlenDetzel, ThomasThomasDetzelMeneghesso, GaudenzioGaudenzioMeneghessoZanoni, EnricoEnricoZanoni2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/31332Power GaN HEMT degradation: from time-dependent breakdown to hot-electron effectsProceedings paperhttps://ieeexplore.ieee.org/document/8614605