Schreurs, DominiqueDominiqueSchreursVandenberghe, S.S.VandenbergheCarchon, GeertGeertCarchonNauwelaers, BartBartNauwelaersVandamme, EwoutEwoutVandammeBadenes, GonçalGonçalBadenesDeferm, LudoLudoDeferm2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4735Evaluation of non-linear modelling techniques for MOSFETs based on vectorial large-signal measurementsProceedings paper