Van Beek, SimonSimonVan BeekRao, SiddharthSiddharthRaoKundu, ShreyaShreyaKunduKim, WoojinWoojinKimO'Sullivan, Barry J.Barry J.O'SullivanCosemans, StefanStefanCosemansYasin, FarukhFarukhYasinCarpenter, RobertRobertCarpenterCouet, SebastienSebastienCouetSharifi, Shamin H.Shamin H.SharifiJossart, NicoNicoJossartCrotti, DavideDavideCrottiKar, GouriGouriKar2022-01-282021-11-022022-01-282022-01-2820211541-7026WOS:000672563100118https://imec-publications.be/handle/20.500.12860/37682Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solutionProceedings paper10.1109/IRPS46558.2021.9405209978-1-7281-6893-7WOS:000672563100118