Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms

Wellekens, DirkDirkWellekensVan Houdt, JanJanVan HoudtFaraone, LorenzoLorenzoFaraoneGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/1015Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanismsJournal article