Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trapping

Hellemans, ThomasThomasHellemansVerreck, DevinDevinVerreckArreghini, AntonioAntonioArreghiniVan den Bosch, GeertGeertVan den BoschRosmeulen, MaartenMaartenRosmeulenHoussa, MichelMichelHoussaVan Houdt, JanJanVan Houdt2025-04-102025-02-232025-04-102024979-8-3315-1636-9N/AWOS:001361822500026https://imec-publications.be/handle/20.500.12860/45239Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trappingProceedings paper10.1109/SISPAD62626.2024.10733042979-8-3315-1635-2WOS:001361822500026