Houssa, MichelMichelHoussaDe Gendt, StefanStefanDe Gendtde Bokx, P.P.de BokxMertens, PaulPaulMertensHeyns, MarcMarcHeyns2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3517Effect of x-ray irradiation on the electrical characteristics of ultra-thin gate oxidesJournal article