Ceric, HajdinHajdinCericSelberherr, SiegfriedSiegfriedSelberherrZahedmanesh, HoumanHoumanZahedmaneshde Orio, RobertoRobertode OrioCroes, KristofKristofCroes2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32672Assessment of Electromigration in Nano-InterconnectsProceedings paperhttps://www.irspconference.com/schedule-and-spreakers