Lorusso, GianGianLorussoRutigliani, VitoVitoRutiglianiVan Roey, FriedaFriedaVan RoeyMack, ChrisChrisMack2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28858Unbiased roughness measurements: subtracting out SEM effectsOral presentationhttp://mne2017.org/wp-content/uploads/2017/10/Booklet_MNE_FINAL_WEB.pdf