A general line-line method for dielectric material characterization using conductors with the same cross-sectional geometry

Bao, XiueXiueBaoLiu, SongSongLiuOcket, IljaIljaOcketBao, JunchengJunchengBaoSchreurs, DominiqueDominiqueSchreursZhang, ShengkangShengkangZhangCheng, ChunyueChunyueChengFeng, KemingKemingFengNauwelaers, BartBartNauwelaers2021-10-252021-10-2520181531-1309https://imec-publications.be/handle/20.500.12860/30197A general line-line method for dielectric material characterization using conductors with the same cross-sectional geometryJournal articlehttps://ieeexplore.ieee.org/document/8310028/