Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applications

Mercha, AbdelkarimAbdelkarimMerchaCreten, YbeYbeCretenPutzeys, JanJanPutzeysMerken, PatrickPatrickMerkenDe Moor, PietPietDe MoorClaeys, CorCorClaeysVan Hoof, ChrisChrisVan HoofSimoen, EddyEddySimoen2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9290Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applicationsProceedings paper