Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd

Manut, AzrifAzrifManutGao, RuiRuiGaoZhang, Jian FuJian FuZhangJi, ZhigangZhigangJiMehedi, MehzabeenMehzabeenMehediZhang, Wei DongWei DongZhangVigar, DavidDavidVigarAsenov, AsenAsenAsenovKaczer, BenBenKaczer2021-10-272021-10-2720190018-9383https://imec-publications.be/handle/20.500.12860/33529Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-VddJournal articlehttps://ieeexplore.ieee.org/document/8636514