Nakamura, H.H.NakamuraNagano, T.T.NaganoSukizaki, H.H.SukizakiSakamoto, K.K.SakamotoTakakura, K.K.TakakuraOhyama, H.H.OhyamaKuboyama, S.S.KuboyamaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14212Radiation damage of Ge diodes and MOSFETs on Ge-on-Si substratesOral presentation