Accelerated device degradation analysis on high speed Ge waveguide photodetectors

Lesniewska, AlicjaAlicjaLesniewskaSrinivasan, AshwynAshwynSrinivasanVan Campenhout, JorisJorisVan CampenhoutO'Sullivan, BarryBarryO'SullivanCroes, KristofKristofCroes2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33411Accelerated device degradation analysis on high speed Ge waveguide photodetectorsMeeting abstracthttps://ieeexplore.ieee.org/document/8720610