3D Integration: Circuit design, test and reliability challenges

Minas, NikolaosNikolaosMinasDe Wolf, IngridIngridDe WolfMarinissen, Erik JanErik JanMarinissenStucchi, MicheleMicheleStucchiOprins, HermanHermanOprinsMercha, AbdelkarimAbdelkarimMerchaVan der Plas, GeertGeertVan der PlasVelenis, DimitriosDimitriosVelenisMarchal, PolPolMarchal2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/176333D Integration: Circuit design, test and reliability challengesProceedings paperhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5560201