Cho, Moon JuMoon JuChoDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselZahid, MohammedMohammedZahidGovoreanu, BogdanBogdanGovoreanuKaczer, BenBenKaczerVan Houdt, JanJanVan HoudtGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-172008-12https://imec-publications.be/handle/20.500.12860/13520How far can we analyze oxide traps spatially with charge injection techniques?Meeting abstract