Verhaege, KoenKoenVerhaegeRobinson-Hahn, D.D.Robinson-HahnRuss, ChristianChristianRussFarris, M.M.FarrisScanlon, J.J.ScanlonLin, D.D.LinVeltri, J.J.VeltriGroeseneken, GuidoGuidoGroeseneken2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1630Justifications for reducing HBM and MM ESD qualification test timeJournal article