A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film

Cretu, BogdanBogdanCretuSimoen, EddyEddySimoenRoutoure, Jean-MarcJean-MarcRoutoureCarin, RegisRegisCarinAoulaiche, MarcMarcAoulaicheClaeys, CorCorClaeys2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22185A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si filmProceedings paper