De Ridder, F.F.De RidderPintelon, R.R.PintelonSchoukens, J.J.SchoukensGilikin, D.P.D.P.Gilikin2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/8793Modified AIC and MDL model selection criteria for short data recordsProceedings paper