Cho, Moon JuMoon JuChoAoulaiche, MarcMarcAoulaicheDegraeve, RobinRobinDegraeveOrtolland, ClaudeClaudeOrtollandKauerauf, ThomasThomasKaueraufKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselHoffmann, Thomas Y.Thomas Y.HoffmannGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-1820100741-3106https://imec-publications.be/handle/20.500.12860/16866Interface/bulk trap recovery after submeltl aser anneal and the impact to NBTI reliabilityJournal article