Hakata, T.T.HakataOhyama, HidenoriHidenoriOhyamaSimoen, EddyEddySimoenClaeys, CorCorClaeysMiyahara, K.K.MiyaharaKawamura, K.K.KawamuraOgita, Y.Y.OgitaTakami, Y.Y.Takami2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3485Degradation of MOSFETs on SIMOX by irradiationJournal article