IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors

Marko, P.P.MarkoMeneghini, M.M.MeneghiniBychikhin, S.S.BychikhinMarcon, DenisDenisMarconMeneghesso, G.G.MeneghessoZanoni, E.E.ZanoniPogany, D.D.Pogany2021-10-202021-10-2020120026-2714https://imec-publications.be/handle/20.500.12860/21108IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistorsJournal articlehttp://www.sciencedirect.com/science/article/pii/S0026271412002272