Enhanced Infrared Imaging for Die-Level Fault Isolation Using Lock-In Thermography

Mankala Ramakrishna Sharma, AnjanashreeAnjanashreeMankala Ramakrishna SharmaJacobs, Kristof J. P.Kristof J. P.JacobsCoenen, DavidDavidCoenenDe Wolf, IngridIngridDe Wolf2025-05-052024-08-162025-05-0520241547-7029WOS:001287475100001https://imec-publications.be/handle/20.500.12860/44315Enhanced Infrared Imaging for Die-Level Fault Isolation Using Lock-In ThermographyJournal article10.1007/s11668-024-02000-xWOS:001287475100001