Cho, Moon JuMoon JuChoHellings, GeertGeertHellingsVeloso, AnabelaAnabelaVelosoSimoen, EddyEddySimoenRoussel, PhilippePhilippeRousselKaczer, BenBenKaczerArimura, HiroakiHiroakiArimuraFang, WWFangFranco, JacopoJacopoFrancoMatagne, PhilippePhilippeMatagneCollaert, NadineNadineCollaertLinten, DimitriDimitriLintenThean, AaronAaronThean2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25078On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowiresProceedings paper\nt3\sherlock\proceedings\IEDM\IEDM2015\DATA\S14P05.PDF