Understanding and Improving Reliability of Oxide-based Resistive RAM for Embedded Application and Storage Class Memory

Chen, MichaelMichaelChen2021-10-242021-10-242017-09https://imec-publications.be/handle/20.500.12860/28013Understanding and Improving Reliability of Oxide-based Resistive RAM for Embedded Application and Storage Class MemoryPHD thesishttps://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS1733271&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1