A study on radiation damage of IGBTs 2-MeV electrons at different temperatures

Nakabayashi, M.M.NakabayashiOhyama, H.H.OhyamaHanano, N.N.HananoKamiya, T.T.KamiyaHirao, T.T.HiraoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9338A study on radiation damage of IGBTs 2-MeV electrons at different temperaturesProceedings paper