Analytical model for dispersion measurement in integrated waveguides using michelson interferometry effects

Yorkel, IsaacIsaacYorkelGirouard, Peter DavidPeter DavidGirouardGalili, MichaelMichaelGalili2025-02-242025-02-242024*****************2100-014XWOS:001353751800035https://imec-publications.be/handle/20.500.12860/45252Analytical model for dispersion measurement in integrated waveguides using michelson interferometry effectsProceedings paper10.1051/epjconf/202430903006WOS:001353751800035GROUP DELAY