De Wolf, IngridIngridDe WolfSimons, VeerleVeerleSimonsSrinivasan, AshwynAshwynSrinivasanVerheyen, PeterPeterVerheyenLoo, RogerRogerLoo2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30568Determining Si composition in SiGe alloys with <1% Si concentrations using Raman spectroscopyProceedings paperhttp://ecst.ecsdl.org/content/86/7/397.abstract