Interconnect test for wide-IO memory-on-logic stacks

Marinissen, Erik JanErik JanMarinissenDeutsch, SergejSergejDeutschKeller, BrionBrionKellerChickermane, VivekVivekChickermaneMukherjee, SubhashishSubhashishMukherjeeSood, NavdeepNavdeepSood2021-10-202021-10-202012-071363-5182https://imec-publications.be/handle/20.500.12860/21105Interconnect test for wide-IO memory-on-logic stacksJournal articlehttp://www.future-fab.com/documents.asp?d_ID=4965