Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependence

Tallarico, AndreaAndreaTallaricoMagnone, PaoloPaoloMagnoneStoffels, SteveSteveStoffelsLenci, SilviaSilviaLenciHu, JieJieHuMarcon, DenisDenisMarconSangiorgi, EnricoEnricoSangiorgiDecoutere, StefaanStefaanDecoutereFiegna, ClaudioClaudioFiegna2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27377Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependenceProceedings paper