Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements

Kim, Hyeon-SuHyeon-SuKimPeric, NemanjaNemanjaPericMinj, AlbertAlbertMinjWouters, LennaertLennaertWoutersSerron, JillJillSerronMancini, ChiaraChiaraManciniKoylan, SerkanSerkanKoylanSergeant, StefanieStefanieSergeantHantschel, ThomasThomasHantschel2025-07-032024-04-152025-07-0320240957-4484WOS:001199599700001https://imec-publications.be/handle/20.500.12860/43842Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurementsJournal article10.1088/1361-6528/ad3744WOS:001199599700001ATOMIC-FORCE MICROSCOPYARTIFACTSMEDLINE:38522105