De Smet, HerbertHerbertDe SmetDe Baets, J.J.De BaetsDe Cubber, A. M.A. M.De CubberDe Vos, JoeriJoeriDe VosVan Calster, AndreAndreVan CalsterVanfleteren, JanJanVanfleteren2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/597New model for the characterization and simulation of TFTs in all operating regionsJournal article