Depth profiling of elastic inhomogeneities in transoarent nanomaterials by picosecond ultrasonic interferometry

Mechri, CCMechriRuello, PPRuelloBreteau, J.M.J.M.BreteauBaklanov, MikhaïlMikhaïlBaklanovVerdonck, PatrickPatrickVerdonckGusev, VVGusev2021-10-182021-10-1820090003-6951https://imec-publications.be/handle/20.500.12860/15847Depth profiling of elastic inhomogeneities in transoarent nanomaterials by picosecond ultrasonic interferometryJournal article