Recent trends in the electrical characterization and reliability assessment of CMOS devices

Groeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveCho, Moon JuMoon JuChoFranco, JacopoJacopoFrancoKaczer, BenBenKaczerMartens, KoenKoenMartensRoussel, PhilippePhilippeRousselToledano Luque, MariaMariaToledano Luque2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20752Recent trends in the electrical characterization and reliability assessment of CMOS devicesMeeting abstract