Inelastic X-ray Scattering Measurement on Single-Crystalline GeSn Thin Film

Chino, M.M.ChinoYokogawa, R.R.YokogawaOgura, A.A.OguraUchiyama, H.H.UchiyamaTatsuoka, H.H.TatsuokaShimura, YosukeYosukeShimura2023-11-032023-05-222023-11-0320230361-5235WOS:000983919100002https://imec-publications.be/handle/20.500.12860/41609Inelastic X-ray Scattering Measurement on Single-Crystalline GeSn Thin FilmJournal article10.1007/s11664-023-10421-xWOS:000983919100002GROWTH