Guo, JinJinGuoPapanikolaou, AntonisAntonisPapanikolaouStucchi, MicheleMicheleStucchiCroes, KristofKristofCroesTokei, ZsoltZsoltTokeiCatthoor, FranckyFranckyCatthoor2021-10-172021-10-1720081530-4388https://imec-publications.be/handle/20.500.12860/13825The analysis of system-level timing failures due to interconnect reliability degradationJournal article