Ohyama, H.H.OhyamaClaeys, CorCorClaeysNakabayashi, H.H.NakabayashiMasakazu, T.T.MasakazuSimoen, EddyEddySimoenHanano, M.M.HananoNaotika, F.F.NaotikaHirao, T.T.Hirao2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7935A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperaturesOral presentation