dos Santos, SaraSarados SantosMartino, JoaoJoaoMartinoAoulaiche, MarcMarcAoulaicheJurczak, GosiaGosiaJurczakSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22278Temperature dependence of LF noise in UTBOX nMOSFETsProceedings paper